Authors:

Shinobu Aoyagi, Hitoshi Osawa, Kunihisa Sugimoto, Akihiko Fujiwara, Shoichi Takeda, Chikako Moriyoshi and Yoshihiro Kuroiwa

Abstract:

Transient atomic displacements during a resonant thickness-shear vibration of AT-cut α-quartz are revealed by time-resolved X-ray diffraction under an alternating electric field. The lattice strain resonantly amplified by the alternating electric field is ∼104 times larger than that induced by a static electric field. The resonantly amplified lattice strain is achieved by fast displacements of oxygen anions and collateral resilient deformation of Si−O−Si angles bridging rigid SiO4 tetrahedra, which efficiently transduce electric energy into elastic energy.

Link:

Appl. Phys. Lett. 107 (2015) 201905.
http://dx.doi.org/10.1063/1.4935591 