|Ultra-fine metal gate operated graphene optical intensity modulator,
R. Kou, Y. Hori, T. Tsuchizawa, K. Warabi, Y. Kobayashi, Y. Harada, H. Hibino, T. Yamamoto, H. Nakajima, and K. Yamada, Appl. Phys. Lett. 109, 251101 (2016).
|Spatially controlled nucleation of single-crystal graphene on Cu assisted by stacked Ni,
D. Ding, P. Solís-Fernández, H. Hibino, and H. Ago, ACS Nano 10, 11196 (2016).
|Quantum Hall effect in epitaxial graphene with permanent magnets,
F. D. Parmentier, T. Cazimajou, Y. Sekine, H. Hibino, H. Irie, D. C. Glattli, N. Kumada, and P. Roulleau, Sci. Rep. 6, 38393 (2016).
|Energy dissipation in graphene mechanical resonators with and without free-edges,
M. Takamura, H. Okamoto, K. Furukawa, H. Yamaguchi, and H. Hibino, Micromachines 7, 158 (2016).
|Atmospheric pressure chemical vapor deposition growth of millimeter-scale single-crystalline graphene on the copper surface with native oxide layer,
S. Wang, H. Hibino, S. Suzuki, and H. Yamamoto, Chem. Mater. 28, 4893 (2016).
|Highly uniform bilayer graphene on epitaxial Cu-Ni(111) alloy,
Y. Takesaki, K. Kawahara, H. Hibino, S. Okada, M. Tsuji, and H. Ago, Chem. Mater. 28, 4583 (2016).
|Applying Strain into Graphene by SU-8 Resist Shrinkage,
M. Takamura, H. Hibino, and H. Yamamoto, J. Phys. D: Appl. Phys. 49, 285303 (2016).
|Growth and low-energy electron microscopy characterizations of graphene and hexagonal boron nitride,
H. Hibino, C.M. Orofeo, S. Wang, and H. Kageshima, Prog. Cryst. Growth Charact. Mater. 62, 155 (2016).
|Etchant-free graphene transfer using facile intercalation of alkanethiol self-assembled molecules at graphene/metal interfaces,
M. Ohtomo, Y. Sekine, S. Wang, H. Hibino, and H. Yamamoto, Nanoscale 8, 11503 (2016).
|Graphene FRET Aptasensor,
K. Furukawa, Y. Ueno, M. Takamura, and H. Hibino, ACS Sensors 1, 710 (2016).
|Theoretical study of graphene on SiC(11-20) a-face,
H. Kageshima and H. Hibino, e-J. Surf. Sci. Nanotechnol. 14, 113 (2016).
|Direct growth of graphene on SiC(0001) by KrF-excimer-laser irradiation,
M. Hattori, H. Ikenoue, D. Nakamura, K. Furukawa, M. Takamura, H. Hibino, and T. Okada, Appl. Phys. Lett. 108, 093107 (2016).